CETC
CETC quality process control system.
Scenes
Significantly improve the efficiency of abnormal monitoring, analysis and feedback of wafer production through automated systems.
value
- Massive quality inspection data is collected in real time, and the delay is controlled within 10 seconds.
- Real-time SPC control and alarm for key product parameters, and abnormal self-diagnosis to improve response speed.
- After a quality abnormal event occurs, feedback is fed back to the manufacturing system to control material input, and an exception handling sheet is generated to record the resolution process and archive it.